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Distefano, S., F. Longo, and M. Scarpa,  "Marking dependency in non-Markovian stochastic Petri nets",  \i Performance Evaluation\i0 , vol. 110: Elsevier B.V., pp. 22-47, 2017.\par \par Longo, F., D. Bruneo, S. Distefano, and M. Scarpa,  "Variable operating conditions in distributed systems: Modeling and evaluation",  \i Concurrency Computation Practice and Experience\i0 , vol. 27, no. 10: John Wiley and Sons Ltd, pp. 2506-2530, 2015.\par \par D., B., D. S., L. F., P. A, and S. M,  "Workload-Based Software Rejuvenation in Cloud Systems",  \i IEEE TRANSACTIONS ON COMPUTERS\i0 , vol. 62, pp. 1072?1085, 2013.\par \par Bruneo, D., S. Distefano, F. Longo, A. Puliafito, and M. Scarpa,  "Workload-based software rejuvenation in cloud systems",  \i IEEE Transactions on Computers - IEEE Computer Society\i0 , vol. 62, no. 6, pp. 1072-1085, 2013.\par \par D., B., D. S., L. F., P. A., and S. M.,  "Evaluating wireless sensor node longevity through Markovian techniques",  \i COMPUTER NETWORKS\i0 , vol. 56, pp. 521?532, 2012.\par \par Bruneo, D., S. Distefano, F. Longo, A. Puliafito, and M. Scarpa,  "Evaluating wireless sensor node longevity through Markovian techniques",  \i Computer Networks - Elsevier \i0 , vol. 56, no. 2, pp. 521-532, 2012.\par \par Distefano, S., F. Longo, and M. Scarpa,  "Availability assessment of HA standby redundant clusters",  \i Proceedings of the 29th IEEE Symposium on Reliable Distributed Systems (SRDS)\i0 , New Delhi, India, 31 October - 3 November 2010, IEEE Computer Society, pp. 265-274, 2010.\par \par Bruneo, D., S. Distefano, F. Longo, A. Puliafito, and M. Scarpa,  "Reliability assessment of wireless sensor nodes with non-linear battery discharge",  \i 2010 IFIP Wireless Days, WD 2010\i0 , Venice, Italy, 20-22 October 2010, IEEE Computer Society, 2010.\par \par Distefano, S., F. Longo, and M. Scarpa,  "Symbolic representation techniques in dynamic reliability evaluation",  \i Proceedings of the 12th IEEE International Symposium on High Assurance Systems Engineering (HASE)\i0 , San Jose, CA, United States, 3-4 November 2010, IEEE Computer Society, pp. 45-53, 2010.\par \par }